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Re: Low "n" - low risk field test sampling plan needed

From: J. Bent
Date: 03 Feb 2000
Time: 11:07:43

Comments

We will collect attribute data (pass/fail for variuos reasons).

We can use service claims to pin point consumers who have experienced difficulties with the current design. Also, certain countries or regions seem to have higher incidence rates for this particular condition than others.

I should point out that this is NOT a product safety issue. This is a quality improvement/customer satisfaction project.

Thanks in advance for your speedy reply.


Last changed: November 20, 2007